Erreur d'E / S, dev sda, secteur xxxxxxxxxx

Question

Titre

Ma machine est tombée en panne plusieurs fois cette semaine. A lancé le test smartmontools et obtenu ce résultat:

=== START OF INFORMATION SECTION === Model Family: Fujitsu MJA BH Device Model: FUJITSU MJA2250BH G2 Serial Number: K94PT972B7RS LU WWN Device Id: 5 00000e 043bcbddd Firmware Version: 8919 User Capacity: 250,059,350,016 bytes [250 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 3f Local Time is: Mon Feb 10 09:24:22 2014 IST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 118) The previous self-test completed having the read element of the test failed. Total time to complete Offline data collection: ( 783) seconds. Offline data collection capabilities: (0x51) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 111) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 078 046 Pre-fail Always - 41112 2 Throughput_Performance 0x0025 253 253 030 Pre-fail Offline - 33619968 3 Spin_Up_Time 0x0023 100 100 025 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 4448 5 Reallocated_Sector_Ct 0x0033 253 253 024 Pre-fail Always - 0 7 Seek_Error_Rate 0x002f 100 100 047 Pre-fail Always - 2140 8 Seek_Time_Performance 0x0025 253 253 019 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 089 089 000 Old_age Always - 5655 10 Spin_Retry_Count 0x0033 253 253 020 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0032 253 253 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 4319 180 Unused_Rsvd_Blk_Cnt_Tot 0x002f 100 100 098 Pre-fail Always - 0 182 Erase_Fail_Count_Total 0x0032 100 100 000 Old_age Always - 0 183 Runtime_Bad_Block 0x0032 253 100 000 Old_age Always - 327680 184 End-to-End_Error 0x0033 253 253 097 Pre-fail Always - 0 185 Unknown_Attribute 0x0030 100 100 000 Old_age Offline - 2 186 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 1441792 187 Reported_Uncorrect 0x0032 100 026 000 Old_age Always - 281470684365183 188 Command_Timeout 0x0032 100 099 000 Old_age Always - 1 189 High_Fly_Writes 0x003a 253 100 000 Old_age Always - 0 190 Airflow_Temperature_Cel 0x0022 067 050 045 Old_age Always - 33 (Min/Max 23/33) 191 G-Sense_Error_Rate 0x0032 253 098 000 Old_age Always - 16580617 192 Power-Off_Retract_Count 0x0032 096 096 000 Old_age Always - 71566404 193 Load_Cycle_Count 0x0032 099 099 000 Old_age Always - 35363 195 Hardware_ECC_Recovered 0x003a 253 253 000 Old_age Always - 20430 196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 100 087 000 Old_age Always - 1 198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 253 253 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 517 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 517 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 00 00 00 a0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ec 00 00 00 00 00 a0 08 00:03:39.320 IDENTIFY DEVICE c8 00 80 80 28 97 ec 08 00:03:30.939 READ DMA c8 00 80 20 2a 97 ec 08 00:03:27.409 READ DMA c8 00 90 c0 5b e2 e5 08 00:03:27.394 READ DMA ca 00 98 00 9b 98 ec 08 00:03:27.393 WRITE DMA Error 516 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 00 00 00 a0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ec 00 00 00 00 00 a0 08 00:03:23.216 IDENTIFY DEVICE c8 00 40 40 28 97 ec 08 00:03:14.822 READ DMA ef 10 02 00 00 00 a0 08 00:03:14.821 SET FEATURES [Reserved for Serial ATA] ec 00 00 00 00 00 a0 08 00:03:14.819 IDENTIFY DEVICE ef 03 45 00 00 00 a0 08 00:03:14.819 SET FEATURES [Set transfer mode] Error 515 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 00 00 00 a0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ec 00 00 00 00 00 a0 08 00:03:14.815 IDENTIFY DEVICE c8 00 40 40 28 97 ec 08 00:03:06.445 READ DMA c8 00 08 18 2a 97 ec 08 00:03:04.772 READ DMA ef 10 02 00 00 00 a0 08 00:03:04.772 SET FEATURES [Reserved for Serial ATA] ec 00 00 00 00 00 a0 08 00:03:04.770 IDENTIFY DEVICE Error 514 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 03 1d 2a 97 ec Error: UNC 3 sectors at LBA = 0x0c972a1d = 211233309 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 18 2a 97 ec 08 00:03:00.416 READ DMA ef 10 02 00 00 00 a0 08 00:03:00.415 SET FEATURES [Reserved for Serial ATA] ec 00 00 00 00 00 a0 08 00:03:00.413 IDENTIFY DEVICE ef 03 45 00 00 00 a0 08 00:03:00.413 SET FEATURES [Set transfer mode] ef 10 02 00 00 00 a0 08 00:03:00.413 SET FEATURES [Reserved for Serial ATA] Error 513 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 03 1d 2a 97 ec Error: UNC 3 sectors at LBA = 0x0c972a1d = 211233309 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 18 2a 97 ec 08 00:02:56.010 READ DMA ea 00 00 00 00 00 a0 08 00:02:55.973 FLUSH CACHE EXT 35 00 08 20 44 d6 e0 08 00:02:55.973 WRITE DMA EXT ea 00 00 00 00 00 a0 08 00:02:55.949 FLUSH CACHE EXT 35 00 38 e8 43 d6 e0 08 00:02:55.949 WRITE DMA EXT SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed: read failure 60% 5618 201724230 # 2 Short offline Completed without error 00% 5617 - # 3 Short offline Completed without error 00% 5617 - # 4 Extended offline Completed without error 00% 5600 - # 5 Short offline Completed: read failure 90% 5595 239457889 # 6 Short offline Completed: read failure 90% 5595 239457889 # 7 Short captive Completed without error 00% 5305 - # 8 Short captive Completed without error 00% 5301 - # 9 Short captive Completed without error 00% 5301 - #10 Short captive Completed without error 00% 5301 - #11 Short captive Completed: read failure 90% 5301 214242167 #12 Extended offline Completed: read failure 60% 4819 176075039 #13 Short offline Completed without error 00% 4819 - #14 Short offline Aborted by Host 90% 214 - #15 Short offline Aborted by Host 90% 214 - #16 Short offline Completed without error 00% 214 - #17 Short offline Completed without error 00% 214 - #18 Short offline Completed without error 00% 4 - #19 Short offline Completed without error 00% 3 - #20 Short offline Completed without error 00% 2 - #21 Short offline Completed without error 00% 1 - 4 of 5 failed self-tests are outdated by newer successful extended offline self-test # 4 SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.

Quelqu'un peut-il s'il vous plaît laissez-moi savoir ce que cela signifie? Devrais-je remplacer mon disque dur immédiatement?

Mise à jour: Comme suggéré par landroni, j’ai exécuté des auto-tests courts et étendus avec gsmartcontrol. L'auto-test court a été exécuté sans erreur. Le test étendu a été abandonné à 40% à cause d'erreurs. Voici la la pâte à partir des journaux d'auto-test:

smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-51-generic] (local build) Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Model Family: Fujitsu MJA BH Device Model: FUJITSU MJA2250BH G2 Serial Number: K94PT972B7RS LU WWN Device Id: 5 00000e 043bcbddd Firmware Version: 8919 User Capacity: 250,059,350,016 bytes [250 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 3f Local Time is: Sun Feb 23 21:13:50 2014 IST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 118) The previous self-test completed having the read element of the test failed. Total time to complete Offline data collection: ( 783) seconds. Offline data collection capabilities: (0x51) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 111) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 078 046 Pre-fail Always - 124861 2 Throughput_Performance 0x0025 253 253 030 Pre-fail Offline - 33619968 3 Spin_Up_Time 0x0023 100 100 025 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 4489 5 Reallocated_Sector_Ct 0x0033 253 253 024 Pre-fail Always - 0 7 Seek_Error_Rate 0x002f 100 100 047 Pre-fail Always - 1157 8 Seek_Time_Performance 0x0025 253 253 019 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 089 089 000 Old_age Always - 5693 10 Spin_Retry_Count 0x0033 253 253 020 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0032 253 253 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 4342 180 Unused_Rsvd_Blk_Cnt_Tot 0x002f 100 100 098 Pre-fail Always - 0 182 Erase_Fail_Count_Total 0x0032 100 100 000 Old_age Always - 0 183 Runtime_Bad_Block 0x0032 253 100 000 Old_age Always - 327680 184 End-to-End_Error 0x0033 253 253 097 Pre-fail Always - 0 185 Unknown_Attribute 0x0030 100 100 000 Old_age Offline - 2 186 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 1441792 187 Reported_Uncorrect 0x0032 100 026 000 Old_age Always - 281470684365183 188 Command_Timeout 0x0032 100 099 000 Old_age Always - 1 189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0 190 Airflow_Temperature_Cel 0x0022 059 050 045 Old_age Always - 41 (Min/Max 37/42) 191 G-Sense_Error_Rate 0x0032 253 098 000 Old_age Always - 16580617 192 Power-Off_Retract_Count 0x0032 096 096 000 Old_age Always - 71566404 193 Load_Cycle_Count 0x0032 099 099 000 Old_age Always - 35590 195 Hardware_ECC_Recovered 0x003a 253 253 000 Old_age Always - 68959 196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 100 087 000 Old_age Always - 1 198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 253 253 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 519 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 519 occurred at disk power-on lifetime: 5685 hours (236 days + 21 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 03 10 00 00 00 Error: Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 00 00 01 01 00 00 00 ff 00:01:40.036 NOP [Abort queued commands] 00 00 01 01 00 00 00 ff 00:01:30.023 NOP [Abort queued commands] 00 00 01 01 00 00 00 ff 00:01:20.011 NOP [Abort queued commands] 2f 00 01 10 00 00 a0 08 00:01:15.009 READ LOG EXT 60 08 38 f0 68 47 40 08 00:01:08.725 READ FPDMA QUEUED Error 518 occurred at disk power-on lifetime: 5685 hours (236 days + 21 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 41 03 d8 5b e2 40 Error: UNC at LBA = 0x00e25bd8 = 14834648 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 08 38 f0 68 47 40 08 00:01:08.725 READ FPDMA QUEUED 60 08 30 40 09 84 40 08 00:01:08.568 READ FPDMA QUEUED 61 08 28 70 09 9d 40 08 00:01:08.243 WRITE FPDMA QUEUED 61 a0 20 00 55 d6 40 08 00:01:07.961 WRITE FPDMA QUEUED 61 08 18 68 09 9d 40 08 00:01:07.594 WRITE FPDMA QUEUED Error 517 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 00 00 00 a0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ec 00 00 00 00 00 a0 08 00:03:39.320 IDENTIFY DEVICE c8 00 80 80 28 97 ec 08 00:03:30.939 READ DMA c8 00 80 20 2a 97 ec 08 00:03:27.409 READ DMA c8 00 90 c0 5b e2 e5 08 00:03:27.394 READ DMA ca 00 98 00 9b 98 ec 08 00:03:27.393 WRITE DMA Error 516 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 00 00 00 a0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ec 00 00 00 00 00 a0 08 00:03:23.216 IDENTIFY DEVICE c8 00 40 40 28 97 ec 08 00:03:14.822 READ DMA ef 10 02 00 00 00 a0 08 00:03:14.821 SET FEATURES [Reserved for Serial ATA] ec 00 00 00 00 00 a0 08 00:03:14.819 IDENTIFY DEVICE ef 03 45 00 00 00 a0 08 00:03:14.819 SET FEATURES [Set transfer mode] Error 515 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 00 00 00 a0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ec 00 00 00 00 00 a0 08 00:03:14.815 IDENTIFY DEVICE c8 00 40 40 28 97 ec 08 00:03:06.445 READ DMA c8 00 08 18 2a 97 ec 08 00:03:04.772 READ DMA ef 10 02 00 00 00 a0 08 00:03:04.772 SET FEATURES [Reserved for Serial ATA] ec 00 00 00 00 00 a0 08 00:03:04.770 IDENTIFY DEVICE SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed: read failure 60% 5692 201724258 # 2 Extended offline Aborted by Host 90% 5691 - # 3 Short offline Completed without error 00% 5690 - # 4 Extended offline Completed: read failure 60% 5618 201724230 # 5 Short offline Completed without error 00% 5617 - # 6 Short offline Completed without error 00% 5617 - # 7 Extended offline Completed without error 00% 5600 - # 8 Short offline Completed: read failure 90% 5595 239457889 # 9 Short offline Completed: read failure 90% 5595 239457889 #10 Short captive Completed without error 00% 5305 - #11 Short captive Completed without error 00% 5301 - #12 Short captive Completed without error 00% 5301 - #13 Short captive Completed without error 00% 5301 - #14 Short captive Completed: read failure 90% 5301 214242167 #15 Extended offline Completed: read failure 60% 4819 176075039 #16 Short offline Completed without error 00% 4819 - #17 Short offline Aborted by Host 90% 214 - #18 Short offline Aborted by Host 90% 214 - #19 Short offline Completed without error 00% 214 - #20 Short offline Completed without error 00% 214 - #21 Short offline Completed without error 00% 4 - 4 of 6 failed self-tests are outdated by newer successful extended offline self-test # 7 SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.

Mise à jour Ran badblocks en utilisant Sudo badblocks -v/dev/sda> bad-blocks-result Résultat: Réussite terminée, 25 mauvaises blocs trouvés. (Erreurs 25/0/0) Que dois-je faire maintenant?

Le fichier de sortie indique les numéros de bloc suivants: 105877868 105877899 105877870 105877871 105877873 105877880 105877810 105877810 105877810 105877810 105877870 105877870 105877870 105877870 105877870

landroni · Answer

Téléchargez gsmartcontrol en tapant Sudo apt-get install gsmartcontrol

Utilisation de gsmartcontrol:

exécutez un short self-test;
s'il se termine sans erreur, exécutez extended self-test.

Si celui-ci convient également, il n'y a probablement aucune raison de paniquer. Si toutefois les tests détectent des blocs défectueux , vous devrez peut-être effectuer une sauvegarde à l'aide de ddrescue ASAP, puis tenter de comprendre en quoi le problème se produit. votre disque dur. C'est peut-être un échec, ou il peut y avoir juste une poignée de secteurs défectueux non pertinents.

Voir également:

METTRE À JOUR:
Étant donné que seule une poignée de secteurs défectueux semble être présente, vous pouvez essayer de dire au FS quels sont ceux qu'il faut éviter d'utiliser fsck.ext3 -c. Mais lisez plutôt man fsck.ext3 (en supposant que ce soit votre FS) avant de l’utiliser.

Voir:

Comment visualiser les mauvais blocs sur le système de fichiers ext3 monté?

user251046 · Answer

On dirait que votre disque échoue mal, je sauvegarderais mes données dès que possible et remplacerais le disque défaillant.

Elder Geek · Answer

J'ai eu un problème similaire récemment et smart a signalé 9 blocs défectueux. J'ai démarré à partir d'un média en direct, puis j'ai réparé le système de fichiers ext4 avec e2fsck -c /dev/SDx où SDx était le lecteur en question (sda dans mon cas). ce qui a abouti à plusieurs lectures courtes que j'ai ignorées et que j'ai forcé à réécrire et à trouver et réparer 5 inodes avec des blocs à réclamations multiples.

Si le lecteur contient des données critiques , vous devez bien sûr utiliser tilisez la stratégie appropriée pour sauvegarder les données avant de faire quoi que ce soit d'autre . Si ce n'est pas comme dans mon cas, lisez la suite. dmesg a signalé presque deux fois plus de secteurs défectueux que ceux détectés par SMART. J'ai donc exécuté e2fsck -cc /dev/SDx où SDx était le lecteur en question afin d'effectuer un test de lecture/écriture non destructif. Il s’agissait clairement d’un processus fastidieux, mais mon objectif étant simplement de gagner encore quelques heures, ce qui constitue à toutes fins pratiques un lecteur de grattage utilisé pour l’expérimentation sans données critiques, en attendant le remplacement. conduire à être livré, je sentais que cela pourrait valoir la peine. Une heure plus tard, à 15% sur un lecteur de téraoctet, je n'en étais pas si sûr, mais comme le remplacement était dans 3 jours, j'ai persévéré. En fin de compte, tous les secteurs défectueux ont été ajoutés à la liste des inodes de blocs défectueux, ce qui les empêche d'être affectés à un fichier ou à un répertoire.